Germany – Instruments for measuring electrical quantities – 300 mm Semi-Automatic RF Probe System for On-Wafer Measurements up to 250 GHz

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Deutschland – Instrumente zum Messen elektrischer Größen – 300 mm Semi-Automatic RF Probe System for On-Wafer Measurements up to 250 GHz

🇩🇪 GermanyContracting authority: IHP GmbH - Leibniz-Institut für innovative Mikroelektronik

Estimated value

Not disclosed

Deadline

Jul 16, 2026

Published

Jun 16, 2026

Procedure

Open

300 mm Semi-Automatic RF Probe System for On-Wafer Measurements up to 250 GHz

Description shown in the original language of the notice.

CPV classification

38341300 — Instruments for measuring electrical quantities38540000 — Machines and apparatus for testing and measuring

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