France – Scanning electron microscopes – Acquisition d'un microscope électronique à balayage, field emission gun (MEB FEG), à pression variable pour l'université de technologie de Compiègne

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France – Microscopes électroniques à balayage – Acquisition d'un microscope électronique à balayage, field emission gun (MEB FEG), à pression variable pour l'université de technologie de Compiègne

🇫🇷 FranceContracting authority: Université de Technologie de Compiègne

Estimated value

Not disclosed

Deadline

Jul 10, 2026

Published

Jun 10, 2026

Procedure

Open

Acquisition d'un microscope électronique à balayage, field emission gun (MEB FEG), à pression variable pour l'université de technologie de Compiègne

Description shown in the original language of the notice.

CPV classification

38511100 — Scanning electron microscopes

Official notice ↗

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