Sweden – Scanning electron microscopes – SEM

Procurement of a high-end, user-friendly and versatile scanning electron microscope (SEM) equipped with state-of-the-art energy dispersive x-ray (EDX) and electron backscattered diffraction (EBSD) detectors. The microscope must be able to perform excellent high-resolution imaging of any type of dry samples regardless of geometry, surface topography, conductivity and magnetic properties.

Description shown in the original language of the notice.

CPV classification